X-Ray (EDS) and Electron Energy Loss Spectroscopies (EELS).
Combined with the STEM mode: chemical composition with spatial resolution; composition maps and profiles.
Vector Field analysis
Magnetic domain studies: Lorentz Microscopy.
Stress and strain studies by HRTEM imaging.
In situ Physical properties measurements
Changes of crystalline phase (Electron diffraction)
Defect structure by Bright Field/Dark Field imaging (BF/DF) and Weak Beam imaging (WBDF).
This 300 kV Field Emission Gun (FEG) TEM is fitted with a SuperTwin® lens allowing a point resolution of 1.9 Å. This TEM can work in TEM and STEM mode. For Z-contrast imaging in STEM mode, it is fitted with a High-Angle Annular Dark Field (HAADF) detector. This TEM is equipped for spectroscopy experiments performed either in EDS (X-Ray Microanalysis) or in Electron Energy Loss spectroscopy (EELS). For the latter, it is fitted with the “Tridiem” Gatan Energy Filter (GIF). This EELS set-up allows Energy Filtered TEM (EFTEM) images to be recorded as well as line spectra or spectrum imaging experiments to be performed. A 2k x 2k Ultrascan CCD camera (Gatan) is located before the GIF for TEM imaging.
In addition to these capabilities the F30 TEM is also fitted with a Lorentz lens which permit the study of magnetic materials in an environment free of magnetic field (for magnetic domain imaging). Furthermore, the F30 allows tomography experiments to be performed both in TEM and STEM mode using a dedicated single tilt holder (+/- 70°) from Fischione.