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Dual Beam and Clean Room Facilities
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Microfabrication: Dual Beam, and Microcaracterization: SEM, XPS, and XRD Areas
Cryogenic Dual Beam Nova 200 (essential)
Dual Beam Helios Nanolab 600 and 650 (essential)
Environmental Scanning Electron Microscope: SEM-Quanta FEG-250, ESEM (complementary)
Field Emission Scanning Electron Microscope CSEM-FEG INSPECT 50 (complementary)
XRD: Bruker D8 Advance High resolution diffractometer (complementary)
XPS-AES: Kratos AXIS UltraDLD, X-Ray Photoelectron Spectrometer (complementary)
Transmission Electron Microscopy (TEM) Area
Titan High-base for High Resolution Imaging: FEI TITAN
3
(essential)
Analytical Titan Low-base: FEI TITAN Low-base (essential)
Transmission Electron Microscope: Tecnai F30 (complementary)
TEM Sample Preparation Service (complementary)
Scanning Probe Microscopy (SPM) Area
Low Temperature (LT), Ultra High Vacuum (UHV-LT) Scanning Probe Microscopy (SPM) Laboratory (essential)
SPM with high magnetic fields and low temperature (essential)
SPM in environmental conditions (complementary)
ICTS
Navigation
Environmental SEM Quanta FEG 250 Service Request
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SEM
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STEM
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