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Microfabrication: Dual Beam, and Microcaracterization: SEM, XPS, and XRD Areas
Cryogenic Dual Beam Nova 200 (essential)
Dual Beam Helios Nanolab 600 and 650 (essential)
Environmental Scanning Electron Microscope: SEM-Quanta FEG-250, ESEM (complementary)
Field Emission Scanning Electron Microscope CSEM-FEG INSPECT 50 (complementary)
XRD: Bruker D8 Advance High resolution diffractometer (complementary)
XPS-AES: Kratos AXIS UltraDLD, X-Ray Photoelectron Spectrometer (complementary)
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Titan Cube
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Tecnai F30
TEM Sample Preparation Service (complementary)
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