[\/et_pb_text][\/et_pb_column][et_pb_column type=”1_2″ _builder_version=”4.9.4″ _module_preset=”default” background_enable_color=”off” custom_padding=”12px||||false|false” border_width_right=”2px” border_color_right=”#FFFFFF” border_width_left=”4px” border_color_left=”#FFFFFF” global_colors_info=”{}”][et_pb_text _builder_version=”4.14.2″ _module_preset=”default” text_font=”|||on|||||” text_text_color=”#FFFFFF” text_font_size=”14px” link_text_color=”#333333″ background_enable_color=”off” custom_padding=”|5px||5px|true|true” hover_enabled=”0″ border_color_all=”RGBA(0,0,0,0)” border_color_right=”#FFFFFF” border_color_left=”#FFFFFF” global_colors_info=”{}” link_text_color__hover=”#4370b4″ link_text_color__hover_enabled=”on|desktop” sticky_enabled=”0″]<\/p>\n
ACCESS ON DEMAND (always available, with fee)<\/a><\/strong><\/p>\n [\/et_pb_text][\/et_pb_column][\/et_pb_row][\/et_pb_section][et_pb_section fb_built=”1″ _builder_version=”4.9.4″ _module_preset=”default” custom_padding=”25px|||||” global_colors_info=”{}”][et_pb_row column_structure=”1_2,1_2″ _builder_version=”4.9.4″ _module_preset=”default” max_width=”75%” custom_padding=”||6px|||” global_colors_info=”{}”][et_pb_column type=”1_2″ _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][et_pb_text _builder_version=”4.9.4″ _module_preset=”default” text_font_size=”16px” text_line_height=”2em” global_colors_info=”{}”]The cryogenic dual beam instrument is dedicated mainly to analysis of electron-sensitive materials (soft materials). The equipment core is based on the Nova Nanolab 200 model, but upgraded with a cryo-setup that allows the analysis of materials at low temperatures. This capability consists of a cryo-transfer setup and a cryo-chamber with embedded sputtering system. For example, this system permits to in situ generate controlled fractures on quenched soft materials, avoiding the mechanical damage associated with room temperature fractures.[\/et_pb_text][et_pb_text disabled_on=”on|on|on” _builder_version=”4.9.4″ _module_preset=”default” text_font=”|700||on|||||” text_text_color=”#FFFFFF” background_color=”#4370b4″ custom_padding=”15px||15px||true|false” link_option_url=”\/wp-content\/uploads\/2021\/09\/Nova_SPA.pdf” border_radii=”on|15px|15px|15px|15px” disabled=”on” global_colors_info=”{}”]<\/p>\n Download PDF<\/p>\n [\/et_pb_text][\/et_pb_column][et_pb_column type=”1_2″ _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][et_pb_image src=”https:\/\/lma.unizar.es\/wp-content\/uploads\/2021\/11\/NOVA-portada.png” title_text=”NOVA portada” _builder_version=”4.14.2″ _module_preset=”default” border_radii=”on|15px|15px|15px|15px” global_colors_info=”{}”][\/et_pb_image][\/et_pb_column][\/et_pb_row][et_pb_row use_custom_gutter=”on” make_equal=”on” _builder_version=”4.9.4″ _module_preset=”default” max_width=”75%” custom_padding=”16px|||||” global_colors_info=”{}”][et_pb_column type=”4_4″ _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][et_pb_text _builder_version=”4.9.4″ _module_preset=”default” text_font_size=”16px” text_line_height=”2em” global_colors_info=”{}”]In addition to the study of the material in its original state (porosity, embedded nano-objects, internal heterogeneities, etc.), any internal distribution of materials can be determined by using the Focused Ion Beam (FIB) to produce cross-sectional surfaces. A combined strategy between this equipment and the Helios Dual Beam Model 650, also available at our Center, is being conducted to produce series of ion-cuts of biological materials embedded in epoxy. These images are being used to produce three-dimensional (3D) information of material distributions. Appropriate software for compositional analysis based on Energy-Dispersive X-ray micro-analysis (EDX) is also included in this equipment. Additionally, the equipment also holds an Omniprobe nanomanipulator for lamellae preparation as well as 5 gas injectors.<\/p>\n The expertise of our scientific and technical staff is also offered to researchers from public and private research centers and also to professionals from industrial sectors that require the use of this instrument.[\/et_pb_text][\/et_pb_column][\/et_pb_row][et_pb_row use_custom_gutter=”on” make_equal=”on” _builder_version=”4.9.4″ _module_preset=”default” max_width=”75%” global_colors_info=”{}”][et_pb_column type=”4_4″ _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][et_pb_tabs active_tab_background_color=”#2ea3f2″ inactive_tab_background_color=”#4370b4″ active_tab_text_color=”#FFFFFF” _builder_version=”4.14.2″ _module_preset=”default” tab_text_color=”#FFFFFF” body_line_height=”1.9em” tab_font=”|700||on|||||” tab_font_size=”15px” tab_line_height=”3em” custom_margin=”||||false|false” custom_padding=”||||false|false” border_radii=”on|15px|15px|15px|15px” global_colors_info=”{}”][et_pb_tab title=”What can be done with this instrument?” _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”]<\/p>\n [\/et_pb_tab][et_pb_tab title=”Sample requirements” _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”]<\/p>\n [\/et_pb_tab][et_pb_tab title=”Technical Specifications” _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”]<\/p>\n [\/et_pb_tab][et_pb_tab title=”APPLICATIONS” _builder_version=”4.14.2″ _module_preset=”default” global_colors_info=”{}”]<\/p>\n a) Pt deposited by e- over multilayer organic magnetic tunnel junctions b) View of milling by i+ beam during the process to make lamella previous to the lift out.<\/em><\/p>\n a) Electron image of lamella of organic magnetic tunnel junctions on the grid. b) Final view of the lamella, ion image c) details and thickness of lamella by ion image, the final process was made at low temperatures (-160 \u00baC)<\/em><\/p>\n (A) General overview of polymers after cryofracture. (B) Details about the internal structure and distribution of Zeolite. (C) Show the spectral analysis of specific zeolite areas, demonstrating the presence of the aluminum and Silicon typical in the zeolite.<\/em><\/p>\n [\/et_pb_tab][\/et_pb_tabs][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=”1_2,1_2″ use_custom_gutter=”on” make_equal=”on” _builder_version=”4.9.4″ _module_preset=”default” max_width=”75%” global_colors_info=”{}”][et_pb_column type=”1_2″ _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][et_pb_image src=”https:\/\/lma.unizar.es\/wp-content\/uploads\/2021\/09\/Nova_1.jpg” title_text=”Nova_1″ _builder_version=”4.9.4″ _module_preset=”default” custom_margin=”||14px|||” border_radii=”on|15px|15px|15px|15px” global_colors_info=”{}”][\/et_pb_image][et_pb_text _builder_version=”4.9.4″ _module_preset=”default” text_font=”||on||||||” text_font_size=”14px” text_line_height=”2em” global_colors_info=”{}”]a) Pt deposited by e- over multilayer organic magnetic tunnel junctions b) View of milling by i+ beam during the process to make lamella previous to the lift out.[\/et_pb_text][\/et_pb_column][et_pb_column type=”1_2″ _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][et_pb_image src=”https:\/\/lma.unizar.es\/wp-content\/uploads\/2021\/09\/Nova_2.jpg” title_text=”Nova_2″ _builder_version=”4.9.4″ _module_preset=”default” custom_margin=”||16px|||” border_radii=”on|15px|15px|15px|15px” global_colors_info=”{}”][\/et_pb_image][et_pb_text _builder_version=”4.9.4″ _module_preset=”default” text_font=”||on||||||” text_font_size=”14px” text_line_height=”2em” global_colors_info=”{}”]a) Electron image of lamella of organic magnetic tunnel junctions on the grid. b) Final view of the lamella, ion image c) details and thickness of lamella by ion image, the final process was made at low temperatures (-160 \u00baC)[\/et_pb_text][\/et_pb_column][\/et_pb_row][et_pb_row use_custom_gutter=”on” make_equal=”on” _builder_version=”4.9.4″ _module_preset=”default” max_width=”75%” global_colors_info=”{}”][et_pb_column type=”4_4″ _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][et_pb_image src=”https:\/\/lma.unizar.es\/wp-content\/uploads\/2021\/09\/Nova_31.png” title_text=”Nova_31″ align=”center” _builder_version=”4.9.4″ _module_preset=”default” custom_margin=”||14px|||” border_radii=”on|15px|15px|15px|15px” global_colors_info=”{}”][\/et_pb_image][et_pb_text _builder_version=”4.9.4″ _module_preset=”default” text_font=”||on||||||” text_font_size=”14px” text_line_height=”2em” text_orientation=”center” global_colors_info=”{}”](A) General overview of polymers after cryofracture. (B) Details about the internal structure and distribution of Zeolite. (C) Show the spectral analysis of specific zeolite areas, demonstrating the presence of the aluminum and Silicon typical in the zeolite.[\/et_pb_text][\/et_pb_column][\/et_pb_row][\/et_pb_section][et_pb_section fb_built=”1″ _builder_version=”4.9.4″ _module_preset=”default” min_height=”179px” custom_margin=”9px||-9px|||” custom_padding=”0px||4px|||” global_colors_info=”{}”][et_pb_row use_custom_gutter=”on” gutter_width=”4″ _builder_version=”4.9.4″ _module_preset=”default” max_width=”75%” custom_margin=”0px|auto||auto||” custom_padding=”55px||||false|false” global_colors_info=”{}”][et_pb_column type=”4_4″ _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][et_pb_gallery gallery_ids=”2911,2910,2909″ posts_number=”3″ show_title_and_caption=”off” show_pagination=”off” module_class=”ilogos” _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][\/et_pb_gallery][\/et_pb_column][\/et_pb_row][\/et_pb_section][et_pb_section fb_built=”1″ _builder_version=”4.9.4″ _module_preset=”default” use_background_color_gradient=”on” background_color_gradient_start=”#000000″ background_color_gradient_end=”rgba(0,0,0,0.48)” background_color_gradient_overlays_image=”on” background_image=”https:\/\/lma.unizar.es\/wp-content\/uploads\/2021\/10\/render-lma-1.jpg” custom_margin=”9px|||||” custom_padding=”||42px|||” saved_tabs=”all” global_colors_info=”{}”][et_pb_row column_structure=”1_3,1_3,1_3″ use_custom_gutter=”on” gutter_width=”2″ _builder_version=”4.9.4″ _module_preset=”default” max_width=”75%” global_colors_info=”{}”][et_pb_column type=”1_3″ _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][et_pb_text _builder_version=”4.9.4″ _module_preset=”default” text_text_color=”#FFFFFF” text_line_height=”2em” global_colors_info=”{}”]<\/p>\n Laboratorio de Microscop\u00edas Avanzadas\n<\/p>\n We are a unique initiative at national and international levels. We provide the scientific and industrial community with the most advanced infrastructures in Nanofabrication, Local Probe and Electron Microscopies for the observation, characterization, nanopatterning and handling of materials at atomic and molecular scale.[\/et_pb_text][\/et_pb_column][et_pb_column type=”1_3″ _builder_version=”4.9.4″ _module_preset=”default” global_colors_info=”{}”][et_pb_text _builder_version=”4.9.4″ _module_preset=”default” text_text_color=”#FFFFFF” link_text_color=”#FFFFFF” global_colors_info=”{}”]<\/p>\n Contact information<\/p>\n Campus R\u00edo Ebro, Edificio Edificio I+D+i<\/p>\n Tel.:(+34) 976 762 980 <\/strong><\/a><\/span>Image<\/strong>\u00a0<\/span>(resolution 1.4 nm)\/\u00a0<\/span>Analysis<\/strong>:<\/h5>\n
By using the different detectors available within this instrument, the following information can be obtained:<\/h5>\n
\n
Image with secondary electrons and topography by means of an ETD\/TLD (Everhart-Thornley\/ Thru-the-Lens Detectors).<\/h5>\n<\/li>\n
Image (back scattered electrons) and composition by using a BSED (Back Scattering Electron Detector).<\/h5>\n<\/li>\n
Image with secondary ions, sensitive to crystallographic direction.<\/h5>\n<\/li>\n
Elementary Chemical Analysis by EDX (Energy-Dispersive X-ray micro-analysis).<\/h5>\n<\/li>\n
STEM (scanning-transmission) images.<\/h5>\n<\/li>\n<\/ul>\n
Nanofabrication<\/strong>\u00a0<\/span>(lateral dimension between 50 nm and tens of microns)<\/h5>\n
\n
FIB: focused ion beam; etching of a predesigned motif over the sample.<\/h5>\n<\/li>\n
FEBID\/FIBID: focused electron\/ion beam induced deposition.<\/h5>\n<\/li>\n<\/ul>\n
PRECURSOR GASES<\/h5>\n
(CH3<\/sub>)3<\/sub>(CpCH3<\/sub>)Pt, Co2<\/sub>(CO)8<\/sub>, W(CO)6<\/sub>, TEOS + H2<\/sub>O \u2013> SiO2<\/sub>, Selective Carbon Mill (MgSO4<\/sub>\u00b77H2<\/sub>0)<\/h5>\n
Micromanipulation<\/strong><\/h5>\n
\n
Lamellae preparation in conventional mode.<\/h5>\n<\/li>\n
Thinning at low temperatures (samples for TEM observation).<\/h5>\n<\/li>\n
Nano-manipulator (Omniprobe).<\/h5>\n<\/li>\n<\/ul>\n
Low Temperature<\/strong><\/h5>\n
\n
Fast freezing and cryo-fracture of materials. Samples can be fractured in the -180 to -150 \u00baC range. The observation can be made between -130 and -140 \u00baC \u00b1 1 \u00baC.<\/h5>\n<\/li>\n<\/ul>\n
\n
\n\n
\n \n Electron beam resolution<\/strong><\/h5>\n<\/td>\n
\n 2.5 nm at 1 kV, 1.4 nm at 15 kV<\/h5>\n<\/td>\n<\/tr>\n
\n \n Ion beam resolution<\/strong><\/h5>\n<\/td>\n
\n 7 nm at 30 kV<\/h5>\n<\/td>\n<\/tr>\n
\n \n Landing Voltage Range<\/strong><\/h5>\n<\/td>\n
\n E-beam: 200 V-30 kV<\/h5>\n
I-beam 2kV-30kV<\/h5>\n<\/td>\n<\/tr>\n
\n \n Probe current<\/strong><\/h5>\n<\/td>\n
\n E-beam 1.4 pA (1kV) up to 37 nA (30kV)<\/h5>\n
I-beam: 1 pA up to 20 nA at 30 kV<\/h5>\n<\/td>\n<\/tr>\n
\n \n High Precision<\/strong><\/h5>\n
5-axes<\/strong><\/h5>\n
motorized stage<\/strong><\/h5>\n<\/td>\n
\n XY: 50 mm<\/h5>\n
Z: 25 mm<\/h5>\n
T: -10 to +60<\/h5>\n
R= 360\u00b0 (continuous)<\/h5>\n<\/td>\n<\/tr>\n
\n \n Chamber<\/strong><\/h5>\n
vacuum<\/strong><\/h5>\n<\/td>\n
\n <2.6 x 10-6<\/sup>\u00a0<\/span>mbar (after 24 h pumping)<\/h5>\n<\/td>\n<\/tr>\n
\n \n Sample Size<\/strong><\/h5>\n<\/td>\n
\n Maximum size: 150 mm diameter with full rotation( larger samples possible with limited rotation).<\/h5>\n
Weight: max 500 g (including the sample holder).<\/h5>\n<\/td>\n<\/tr>\n
\n \n Cryo-option<\/strong><\/h5>\n
Model PPT2000 with Cryo-transfer from Quorum Technologies<\/strong><\/h5>\n<\/td>\n<\/tr>\n
\n \n Transfer<\/strong><\/h5>\n<\/td>\n
\n After freezing and vacuum transfer the sample is placed on the preparation chamber cold stage. Stage temperature is normally set to between -130o<\/sup>C and -140o<\/sup>C (precisely controlled to with +or- 1C)<\/h5>\n<\/td>\n<\/tr>\n
\n \n Fracturing<\/strong><\/h5>\n<\/td>\n
\n Sample can be fractured using either the cooled probe or cryo knife Tools.<\/h5>\n<\/td>\n<\/tr>\n
\n \n SUBLIMATION (ETCHING):<\/strong><\/h5>\n<\/td>\n
\n Water (ice) can be sublimed (etched) from the sample by raising the stage temperature (typically to between -80o<\/sup>C and -100o<\/sup>C.<\/h5>\n<\/td>\n<\/tr>\n
\n \n COATING<\/strong><\/h5>\n<\/td>\n
\n Sample is sputter coated with Pt or C and then transferred in to the SEM cold stage.<\/h5>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n
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<\/p>\n
50018<\/span> Zaragoza (Espa\u00f1a)<\/span><\/span><\/div>\n
lma@unizar.es<\/strong><\/a><\/span>