What kind of information can be obtained with this instrument?
These features allow performing many of the STM/AFM related techniques:
- Surface morphology. Topography with resolution below 1 nm.
- Electrical conductivity (c‐AFM). Quantitative local electrical resistance measurements.
- Local electrical potential (KPM). Qualitative measurements of local charge distribution.
- Magnetic properties (MFM). Magnetic properties analysis under magnetic fields.
- Piezo-electric properties (PFM). Using the tip as electrode and deformation sensor.
- Thermal dependence. Capacity to measure in the 2 to 500 K range.
- Topography based in low vacuum Scanning Tunnel Microscopy (STM).
- The sample should be immobilized onto a flat substrate
- The sample should exhibit a roughness lower than the range of the piezo scanner.
- The size of the sample should be small enough to fit inside of the microscope, around 1cm2 and a maximum thickness of 0.5 cm.
- The sample should be compatible with low temperature and vacuum conditions.
- AFM/MFM head with interferometric sensor.
- STM/Tuning Fork head.
- Variable temperature insert (1.5 K-300 K) cryostat.
- 8 T (vertical) and 2 T (in-plane) superconducting magnet, that combined with a rotating platform allows to apply vector fields in three dimensions.
- Compatible chip carrier with dual-beam and pulsed field facilities.