Microfabrication: Dual Beam, and Microcaracterization: SEM, XPS, and XRD Areas Microfabrication: Dual Beam, and Microcaracterization: SEM, XPS, and XRD Areas Cryogenic Dual Beam Nova 200 Dual Beam Helios Nanolab 600 and 650 Environmental Scanning Electron Microscope SEM-Quanta FEG 250, ESEM Field Emission Scanning Electron Microscope CSEM-FEG INSPECT 50 XRD: Bruker D8 Advance High Resolution Diffractometer XPS-AES: Kratos AXIS Ultra DLD X-Ray Photoelectron Spectrometer
Cryogenic Dual Beam Nova 200
Dual Beam Helios Nanolab 600 and 650
Environmental Scanning Electron Microscope SEM-Quanta FEG 250, ESEM
Field Emission Scanning Electron Microscope CSEM-FEG INSPECT 50
XRD: Bruker D8 Advance High Resolution Diffractometer
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