What kind of information can be obtained with these instruments?
Scanning Probe Microscopy and spectroscopy:
- Structural characterization with atomic resolution of metallic and insulating surfaces.
- Fast loading approach and flexible design for quick characterization of samples grown in-situ or taken as-prepared from the outside.
- Force spectroscopy with sub-Å Z resolution
- Chemical contrast mapping with atomic resolution using repulsive or attracting tip-atom forces.
- Dedicated Kelvin Probe Microscopy module.
Real-time physical-chemical characterization of 2D materials:
- Real-time monitoring of surface dynamics up to 900 ºC
- Controlled gas-dosing in-situ during scanning.
- Capable of scanning during evaporation of organic or inorganic materials.
Temperature range: 100 (LN2 flow cryostat) to 1200 K (radiative heater)
LN2 hold time: 24 hours
Z topographic noise: 5 pm peak-peak; <2000 fm/ÖHz
Thermal drift at low temperatures: Standard STM grade images can be obtained with scan time <5 min at temperatures <250 K.
Thermal drift at high temperatures: For T<600 ºC standard STM grade images can be obtained after thermal relaxation of about 15 min. For 600 ºC < T < 900 ºC scan time is limited to 5-10 minutes.
Minimum stable oscillation amplitude of Kolibri sensor for nc-AFM: 90 pm
Force resolution: <1 pN
Maximum operating pressure: 1´10-5 mbar.
In-situ tip conditioning
Sample preparation: (shared with SPECS JT-STM) 3 ion-guns, 3 e-beam heaters (100-1300ºC). 1 flash heater (>2000 ºC in 25 seconds), low energy electron diffraction and Auger spectroscopy (SPECS ErLEED 150), quadrupole mass spectrometer for residual gas analysis, 7 leak-valves for controlled gas injection, 1 SPECS EBE4 and 1 SPECS EBE1 e-beam evaporators, 2 parking stations for mini-UHV transportable organic evaporators, 1 high temperature effusion cell (CreaTec)