What can be this equipment used for?
Scanning tunneling microscopy and spectroscopy:
- Structural and electronic characterization with sub-molecular resolution.
- Band structure characterization in reciprocal space by means of quasiparticle interference patterns.
- High-resolution structural characterization using CO functionalized tips.
- Tip manipulation of atoms and molecules.
Atomic force microscopy:
- Study of all types of samples: from insulating to metallic.
- Simultaneous recording of forces and conductance.
- Map acquisition of electronic charge (surface potential) down to the sub-molecular scale.
Temperature range: 4.7 K, 78 K and 300 K
LHe / LN2 hold time: 62 /48 hours
Z topographic noise: 3 pm peak-peak; <500 fm/(Hz)^(1/2)
Energy /force resolution: 1 mV / 1 pN
Minimum stable Qplus oscillation: 20-30 pm
In-situ tip exchange.
Quick cooling and stabilization of the piezo
Maximum sample size: 3 mm thick and 10 mm wide.
Sample preparation: Combined resistive heating and LN2 cooling manipulator (temperature range 100 – 1100 K). Low energy electron diffraction equipment (LEED), mass spectrometer (quadrupole) for detection of residual gases, 2 ion guns, 4 leak valves for controlled gas injection, 1 metal evaporator (e-beam) and 2 organic evaporators (resistive heating). Accessory pumping stations. Carrousel with capacity for up to 4 samples.